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Volume 16, Issue 5 (September 1988)

ISSN: 1945-7553
CODEN: JTEVAB
Page Count: 5


X-Ray Residual Stress Measurements in Notched Test Specimens

Dowling, NE
Professor, Virginia Polytechnic Institute and State University, Blacksburg, VA

Hendricks, RW
Professor, Virginia Polytechnic Institute and State University, Blacksburg, VA

Ranganathan, K
Georgia Institute of Technology, Atlanta, GA

(Received 18 May 1987; accepted 11 March 1988)

Abstract

X-ray residual stress measurements were made in notched test specimens of 7475-T651 aluminum and annealed Ti-6Al-4V in a configuration designed to simulate fatigue testing in a tensile testing machine. An automated and portable X-ray stress analysis system with a position-sensitive proportional counter was used for making the measurements. Sources of error in the measurements resulted from counting statistics, grain size, and preferred orientation in the specimen, and the radius of curvature of the notch. The feasibility of in situ residual stress measurements during brief pauses in fatigue testing is demonstrated.



Keywords:
X-ray residual stress measurements, notched test specimens, tensile testing machine

Paper ID: JTE11620J
DOI: 10.1520/JTE11620J
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Author Title X-Ray Residual Stress Measurements in Notched Test Specimens Symposium , 0000-00-00 Committee E28