ISSN: 1945-7553
CODEN: JTEVAB
Page Count: 7

An X-Ray Diffraction Analysis of Residual Stresses Induced by Sliding Wear of Copper-Aluminum Alloys

Wert, JJ
George A. Sloan professor of metallurgy and research assistantmember of ASTM, Vanderbilt University, Nashville, TN

Singerman, SA
Research engineer, Pratt and Whitney, West Palm Beach, FL

Quarles, RA
George A. Sloan professor of metallurgy and research assistantmember of ASTM, Vanderbilt University, Nashville, TN

Chaudhuri, DK
Associate professor, Tennessee State University, Nashville, TN

Abstract

Residual stresses induced during unlubricated sliding contact have been measured by the two-exposure technique as well as by peak shift analysis. The peak shift analysis provides the necessary information for the determination of the sum of the principal residual stresses and stacking fault probability. The results of the lattice parameter method suggested by Wagner are compared with those obtained via the conventional two-exposure X-ray technique. If the 222 and 400 reflections are of sufficient intensity, either method may be used to determine the state of stress. However, if the peaks are very diffuse because of strain hardening, the two-exposure technique yields the most reliable results.

Keywords:
X-ray diffraction, residual stress, wear, stacking fault energy

Paper ID: JTE11416J
DOI: 10.1520/JTE11416J
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