“PARS”—A Portable X-Ray Analyzer for Residual Stresses

    Volume 6, Issue 2 (March 1978)

    ISSN: 0090-3973


    Page Count: 7

    James, M
    research associate, Laboratorium voor Fysische Metaalkunde, Nijenborgh 18, Universiteitscomplex Paddepoel, University of Groningen,

    Cohen, JB
    Frank C. Engelhart professor of materials science and chairman of the Department of Materials Science and Engineering, The Technological Institute, Northwestern University, Evanston, Ill.


    The design, operation, and testing of a 7 to 11-kg hand-held X-ray device for measuring residual stresses are described. The instrument is based on a miniature X-ray tube and generator and a position-sensitive detector. No motion of the detector is needed to record a peak, eliminating the expensive and heavy gearing characteristic of a conventional diffractometer; the only mechanical motion during a measurement is one change of the orientation of the device to the object. An entirely portable instrument is therefore available for use in the plant or in the field. Tests are reported in which the stress is measured to ±40 MPa (± 6 ksi) or better in 4 to 20 s, depending on the specimen.

    Paper ID: JTE10925J

    DOI: 10.1520/JTE10925J

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    Title “PARS”—A Portable X-Ray Analyzer for Residual Stresses
    Symposium , 0000-00-00
    Committee E28