Volume 13, Issue 1 (January 1985)

    An Optical Test Method for Measuring Biaxial Deformations

    CODEN: JTEOAD

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    Abstract

    A new and simple method is described for the measurement of biaxial deformation with a resolution of 0.025 μm (1 μin.). The basis for this technique is the use of an optical extensometer.


    Author Information:

    Polvani, RS
    Metallurgist, mathematical statistician, and physical science technician, National Bureau of Standards, Washington,DC,

    Reeve, CP
    Metallurgist, mathematical statistician, and physical science technician, National Bureau of Standards, Washington,DC,

    Veale, RC
    Metallurgist, mathematical statistician, and physical science technician, National Bureau of Standards, Washington,DC,


    Stock #: JTE10762J

    ISSN: 0090-3973

    DOI: 10.1520/JTE10762J

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    Author
    Title An Optical Test Method for Measuring Biaxial Deformations
    Symposium , 0000-00-00
    Committee E08