Room Temperature Capacitance and Dissipation Factor Measurement of Chip Capacitors—An Interlaboratory Evaluation

    Volume 8, Issue 6 (November 1980)

    ISSN: 0090-3973

    CODEN: JTEOAD

    Page Count: 5


    Lo, WC
    Member of the technical staffMember of ASTM, Bell Telephone Laboratories, Inc., Allentown, Pa.

    Abstract

    An interlaboratory test on room temperature measurement of unencapsulated multilayer ceramic capacitors (commonly known as chip capacitors) was conducted under the sponsorship of ASTM Committee F01 on Electronics. Results show that a well-defined method of test is needed to get agreement among mesurements of capacitance and dissipation factors for this type of capacitor.


    Paper ID: JTE10627J

    DOI: 10.1520/JTE10627J

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    Author
    Title Room Temperature Capacitance and Dissipation Factor Measurement of Chip Capacitors—An Interlaboratory Evaluation
    Symposium , 0000-00-00
    Committee F01