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Volume 8, Issue 6 (November 1980)

ISSN: 1945-7553
CODEN: JTEVAB
Page Count: 5


Room Temperature Capacitance and Dissipation Factor Measurement of Chip Capacitors—An Interlaboratory Evaluation

Lo, WC
Member of the technical staffMember of ASTM, Bell Telephone Laboratories, Inc., Allentown, Pa.

Abstract

An interlaboratory test on room temperature measurement of unencapsulated multilayer ceramic capacitors (commonly known as chip capacitors) was conducted under the sponsorship of ASTM Committee F01 on Electronics. Results show that a well-defined method of test is needed to get agreement among mesurements of capacitance and dissipation factors for this type of capacitor.



Keywords:
capacitance, dissipation factor, ceramic capacitors, chip capacitors, multilayer ceramic capacitors, monolithic ceramic capacitors, temperature characteristics of capacitance

Paper ID: JTE10627J
DOI: 10.1520/JTE10627J
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Author Title Room Temperature Capacitance and Dissipation Factor Measurement of Chip Capacitors—An Interlaboratory Evaluation Symposium , 0000-00-00 Committee F01