Journal Published Online: 01 September 1977
Volume 5, Issue 5

Application of an Optical Heterodyne Interferometer to the Inspection of Surfaces

CODEN: JTEVAB

Abstract

The application of a high accuracy, wide bandwidth optical heterodyne interferometer to the inspection of surfaces is described and sample data are given. The data format should make the system particularly suitable for automatic inspection systems.

Author Information

Lavan, MJ
Research Directorate, Gen. Thomas J. Rodman Laboratory, Rock Island Arsenal, Rock Island, Ill.
Van Damme, GE
Research Directorate, Gen. Thomas J. Rodman Laboratory, Rock Island Arsenal, Rock Island, Ill.
Cadwallender, WK
Research Directorate, Gen. Thomas J. Rodman Laboratory, Rock Island Arsenal, Rock Island, Ill.
DeYoung, TF
Research Directorate, Gen. Thomas J. Rodman Laboratory, Rock Island Arsenal, Rock Island, Ill.
Pages: 2
Price: $25.00
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Details
Stock #: JTE10546J
ISSN: 0090-3973
DOI: 10.1520/JTE10546J