Volume 40, Issue 3 (May 2012)

    Microstructure Characterization of Mesoporous Materials by FE-SEM

    (Received 21 August 2011; accepted 15 February 2012)

    Published Online: 2012

    CODEN: JTEOAD

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    Abstract

    Three types of mesoporous materials were observed directly by field emission-scanning electron microscopy (FE-SEM). The effects of accelerating voltage on these materials are discussed. Our results show that low-accelerating voltage could facilitate the observation of SBA-15 and TUD-1 mesoporous zeolite. However, as for mesoporous silica nano-spheres, high-accelerating voltage was helpful for the observation of surface structure.


    Author Information:

    Wei, Wu
    Key Laboratory for Ultrafine Materials of Ministry of Education, School of Materials Science and Engineering, East China Univ. of Science and Technology, Shanghai,

    The State Key Laboratory of High Performance Ceramics and Superfine Microstructures, Shanghai Institute of Ceramics, Chinese Academy of Sciences, Shanghai,

    Ziwei, Liu
    The State Key Laboratory of High Performance Ceramics and Superfine Microstructures, Shanghai Institute of Ceramics, Chinese Academy of Sciences, Shanghai,

    Jiajie, Hua
    The State Key Laboratory of High Performance Ceramics and Superfine Microstructures, Shanghai Institute of Ceramics, Chinese Academy of Sciences, Shanghai,

    Yi, Zeng
    The State Key Laboratory of High Performance Ceramics and Superfine Microstructures, Shanghai Institute of Ceramics, Chinese Academy of Sciences, Shanghai,

    The State Key Laboratory of High Performance Ceramics and Superfine Microstructures, Shanghai Institute of Ceramics, Chinese Academy of Sciences, Shanghai,

    Yongsheng, Li
    Key Laboratory for Ultrafine Materials of Ministry of Education, School of Materials Science and Engineering, East China Univ. of Science and Technology, Shanghai,


    Stock #: JTE104285

    ISSN: 0090-3973

    DOI: 10.1520/JTE104285

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    Author
    Title Microstructure Characterization of Mesoporous Materials by FE-SEM
    Symposium , 0000-00-00
    Committee E42