Goodness-of-Fit of the Ramberg-Osgood Analytic Stress-Strain Curve to Tensile Test Data

    Volume 10, Issue 6 (November 1982)

    ISSN: 0090-3973

    CODEN: JTEOAD

    Page Count: 6


    Papirno, R
    Mechanical engineerMember of ASTM, Army Materials and Mechanics Research Center, Watertown, MA

    Abstract

    One form of the Ramberg-Osgood analytic approximation of the stress-strain curve, which uses the 0.2% offset yield stress as one of the three parameters, has recently been approved for inclusion in Military Standardization Handbook-5. Using the root-mean-square error as a criterion, the fit of this formulation to data from 2357 tension tests of various materials was found to be excellent. In 90% of the tests, the root-mean-square error in stress was less than 1% of the yield stress and in half the tests the error was less than 0.4% of the yield stress.


    Paper ID: JTE10264J

    DOI: 10.1520/JTE10264J

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    Author
    Title Goodness-of-Fit of the Ramberg-Osgood Analytic Stress-Strain Curve to Tensile Test Data
    Symposium , 0000-00-00
    Committee D30