Volume 2, Issue 2 (March 1974)

    Sources and Magnitude of Errors in the Measurement of Coating Thickness with the Double-Beam Interference Microscope

    CODEN: JTEOAD

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    Abstract

    An analysis was made of three factors (fringe width, phase change, and surface roughness) which contribute to errors in measurement of coating thickness with a double-beam interference microscope. Excluding any unpredictable contributions made by surface roughness, a theoretical analysis based on a literature search revealed that the total of the two remaining errors will not exceed ±0.19 μm (±0.0076 mil) if either the coating or its substrate is a metal. If both are metals, the error will not exceed ±0.12 μm (±0.0048 mil). Measurements were made on a few samples of common coating systems. The errors experienced were much less than the above theoretical values, and would not normally contribute significantly to measurements with the double-beam interference microscope.


    Author Information:

    Saur, RL
    Senior physical chemist, General Motors Research Laboratories, Warren, Mich.


    Stock #: JTE10080J

    ISSN: 0090-3973

    DOI: 10.1520/JTE10080J

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    Author
    Title Sources and Magnitude of Errors in the Measurement of Coating Thickness with the Double-Beam Interference Microscope
    Symposium , 0000-00-00
    Committee E41