ISSN: 1945-7553
Page Count: 6

Acquisition of Computer Aided Design/Analysis Models for Semiconductors

Case, GR
Sandia Laboratories, Albuquerque,New Mexico

Abstract

Because of the role of the digital computer in the design and analysis of electronic systems, it is becoming increasingly desirable to have suitable computer aided analysis models of semiconductor devices at the time these devices are available for experimental development. This paper describes the development of such computer aided design/analysis (CAD/A) models. The procedures described can be used to develop models based on statistically significant populations of devices. The statistical procedures for selecting devices to be tested, the testing procedures, and the computer codes used for reducing data are described. Examples of computer output and a complete CAD/A model derived using the procedure are included for a sample device.

Keywords:
computer aided analysis, computer aided design, data reduction, diode models, modeling, semiconductor modeling, semiconductor testing, transistor modeling

Paper ID: JTE10019J
DOI: 10.1520/JTE10019J
ASTM International is a member of CrossRef.