(Received 13 June 2004; accepted 19 June 2006)
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With the development of computing systems for data processing, the image processing and image analyzing methods have been developed on the basis of pixel assessment. These methods can analyze and detect the images by assigning a value for each pixel and using the matrices calculations. In the present research, two methods have been used to assess the simulated material microstructures. In the first method, the vertices of the microstructure are counted to determine accurately the mean grain size by the Euler's relationship, while in the second method, the image processing and image analyzing methods are utilized to assess the microstructure image. To verify the accuracies of the methods their results were compared with the experimental results achieved using the standard Heyn intercept method. It was found that in comparison with the common grain size measurement, the image processing method presents a higher accuracy compared with the Eulers's relationship. More information about the microstructure properties such as the mean grain size and the size of the largest grain in the presence of second phase particles are evaluated.
Hafez Haghighat, SM
Ph.D. student, EPFL, ODGA-C103, CRPP-EPFL,
Karimi Taheri, A.
Corresponding author, Professor, Sharif University of Technology, Tehran,
Stock #: JTE100143