ISSN: 0090-3973
Page Count: 6

Use of X-Ray Diffraction for Measuring Recrystallization of Low Carbon Steels for Tin Plate Application
Liao, KC
Senior Research Metallurgist, National Steel Corporation, MI

Abstract

An X-ray diffraction technique has been investigated as an alternative to the conventional Rockwell (R) superficial scale 30T hardness testing to evaluate the applicability of tin mill products. Cold-rolled low carbon steels for T-4 and T-5 tin plate applications were heat treated in a salt pot at temperatures ranging from 627 to 677°C for times between 1 and 120 s to simulate various continuous annealing cycles. X-ray diffraction patterns of the 211 line were obtained, and conventional R 30T hardness measurements were made on the cold reduced and annealed specimens. Test results show that an X-ray line broadening parameter can be established for monitoring the progress of recrystallization in the annealed steel.

Keywords:
low carbon steels, tin mill products, continuous annealing, recrystallization, Rockwell superficial hardness, X-ray diffraction, X-ray line broadening

Paper ID: JTE12496J
DOI: 10.1520/JTE12496J
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