Digital Library / Journals / Journal of Testing and Evaluation (JTE) / Citation Page

ISSN: 0090-3973
Published Online: 1 March 1999
Page Count: 6

Failure Analysis Using Microfocus X-ray Imaging
Bossi RH

Abstract
Failure analysis is an essential element of all engineered products. The goal of failure analysis is the understanding of the root causes of any undesirable effects. Microfocus X-ray imaging (radioscopy and computed tomography) offers detailed information on the internal assembly and material condition of objects under failure analysis investigation. Using advanced systems for the acquisition of radioscopic and computed tomography (CT) images, failure analysis investigations are improved in technical accuracy at a reduced flow time and cost over alternative approaches. A versatile microfocus radioscopic system with CT capability has been implemented successfully as a standard tool in the Boeing Phantom Works Failure Analysis Laboratory. Using this tool, studies of electronic, electromechanical, and composite material items have been performed. Such a system can pay for itself within two years through higher productivity of the laboratory, increased laboratory value to the company, and resolution of critical problems whose worth far exceeds the value of the equipment.

Keywords:
failure analysis, X-ray, imaging, microfocus, radioscopy, computed tomography, electronics, composites

Paper ID: JTE12052J
DOI: 10.1520/JTE12052J
ASTM International is a member of CrossRef.