Back-Face Strain Compliance and Electrical-Potential Crack Length Calibrations for the Disk-Shaped Compact-Tension DC(T) Specimen

Digital Library / Journals / Journal of Testing and Evaluation (JTE) / Citation Page

Volume 22, Issue 2 (March 1994)

Click here to download this paper now for $25 PDF (152K)

View License Agreement

ISSN: 0090-3973
Page Count: 4

Back-Face Strain Compliance and Electrical-Potential Crack Length Calibrations for the Disk-Shaped Compact-Tension DC(T) Specimen
Gilbert, CJ
University of California, CA

McNaney, JM
University of California, CA

Dauskardt, RH
University of California, CA

Ritchie, RO
University of California, CA

(Received 20 July 1993; accepted 11 October 1993)

Abstract

Back-face strain compliance and electrical-potential crack length calibrations have been experimentally determined for the disk-shaped compact-tension DC(T) specimen. Finite-element modeling was used to ascertain the back-face strain distribution at several crack lengths to determine the significance of inconsistent gage placement. The numerical solutions demonstrated good agreement with experiment, especially at smaller crack lengths when the back-face strain gradients are minimal. It is concluded that precise gage placement is only critical when the crack tip closely approaches the back of the test specimen.

Keywords:
back-face strain compliance, electrical-potential calibration, disk-shaped compact-tension DC(T) specimen

Paper ID: JTE12644J
DOI: 10.1520/JTE12644J
ASTM International is a member of CrossRef.

Author Title Back-Face Strain Compliance and Electrical-Potential Crack Length Calibrations for the Disk-Shaped Compact-Tension DC(T) Specimen Symposium , 0000-00-00 Committee D30

		Home Journals STPs Manuals Topics Subscriptions/Pricing Digital Library / Journals / Journal of Testing and Evaluation (JTE) / Citation Page Volume 22, Issue 2 (March 1994) Click here to download this paper now for $25 PDF (152K) View License Agreement ISSN: 0090-3973 Page Count: 4 Back-Face Strain Compliance and Electrical-Potential Crack Length Calibrations for the Disk-Shaped Compact-Tension DC(T) Specimen Gilbert, CJ University of California, CA McNaney, JM University of California, CA Dauskardt, RH University of California, CA Ritchie, RO University of California, CA (Received 20 July 1993; accepted 11 October 1993) Abstract Back-face strain compliance and electrical-potential crack length calibrations have been experimentally determined for the disk-shaped compact-tension DC(T) specimen. Finite-element modeling was used to ascertain the back-face strain distribution at several crack lengths to determine the significance of inconsistent gage placement. The numerical solutions demonstrated good agreement with experiment, especially at smaller crack lengths when the back-face strain gradients are minimal. It is concluded that precise gage placement is only critical when the crack tip closely approaches the back of the test specimen. Keywords: back-face strain compliance, electrical-potential calibration, disk-shaped compact-tension DC(T) specimen Paper ID: JTE12644J DOI: 10.1520/JTE12644J ASTM International is a member of CrossRef. Author Title Back-Face Strain Compliance and Electrical-Potential Crack Length Calibrations for the Disk-Shaped Compact-Tension DC(T) Specimen Symposium , 0000-00-00 Committee D30