Published Online: 30 August 2004
Page Count: 15
Professor, Korea Advanced Institute of Science and Technology, Seoul,
Assistant Professor, Division of Mechanical and Automotive Engineering, Yosu National University, Yosu Chonnam,
Principal Engineer, E-CIM Center, Corporate Technology Operations, Samsung Electronics Co., Kyunggido,
(Received 23 April 2002; accepted 20 September 2002)
Crack growth and closure behavior of physically short and conventionally long cracks under random loading are extensively investigated, utilizing test results of 2024-T351 aluminum alloy obtained by performing narrow- and wide-band random loading tests for various stress ratios and random loading block lengths. A noise reduction method is developed to determine the crack opening load under random loading more easily, precisely, and economically. Crack growth rates are analyzed mainly in terms of the stress intensity factor range estimated by 2/PI correction proposed by Donald and Paris. The long and short cracks are very different in characteristics of closure behavior under random loading. Crack growth of short and long cracks under random loading can be well described by the crack closure concept. The effects of random spectrum or random block length on crack opening load and crack growth are not significant.
Paper ID: JAI19029