Spectro Analytical Instruments, Fitchburg, MA
(Received 8 October 2004; accepted 11 April 2005)
Polarized X-Ray EDXRF has been used for the analysis of low levels of a broad range of elements in light matrices for a long time. By using the polarization of the excitation radiation, the background scattered by the sample is drastically reduced. For the analysis of low sulfur in automotive fuels, this meant a detection limit comparable to the WDXRF technique.
Recent developments in detector technology and in closed coupled static geometry result in further improvement of sensitivity for this application.
This paper shows the development of this technique for the analysis of low sulfur content in petroleum products. It shows the results of a round robin test, performed by CEN TC 19 WG 27 in 2001.
The technical basis of these data is compared to the recent technical developments, and future options are shown. The influence by sample preparation and sample presentation, which might be special for this analytical technique, is investigated and discussed.
Paper ID: JAI12975