ISSN: 1546-962X
CODEN: JAIOAD
Published Online: 13 July 2005
Page Count: 6

Photo Thermal Micro-Spectroscopy — A New Method for Infared Analysis of Materials

Slough, CG
TA Instruments, New Castle, DE

Hammiche, A
Lancaster University, Lancaster,

Reading, M
University of East Anglia, Norwich,

Pollock, HM
Lancaster University, Lancaster,

(Received 11 June 2004; accepted 17 May 2005)

Abstract

Many modern materials are composite structures with complex morphologies that play a large role in determining the material function. The ability to investigate the relationship between structure and property on a microscopic scale can play a crucial role in material development. Micro-Thermal Analysis (μTA)™ is a unique set of analytical techniques for characterizing materials on a micrometer and nanometer scale. Micro-TA combines the imaging power of atomic force microscopy with the ability to analyze physical, mechanical, thermal, and chemical characteristics at a specific point of interest on the surface of a material. At the heart of the technique is a miniaturized thermal probe. In a new technique termed Photo Thermal Micro-Spectroscopy (PTMS), this thermal probe is used to detect temperature fluctuations in samples that have been irradiated by IR radiation. A Fourier Transform Infrared (FT-IR) spectrum can be constructed from this information. This paper describes the PTMS technique and discusses recent applications.

Keywords:
Atomic Force Microscopy, Scanning Thermal Microscopy, Photothermal, Infared Spectroscopy, Infared Microscopy, FT-IR, Microspectroscopy

Paper ID: JAI12800
DOI: 10.1520/JAI12800
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