SEDL / Geotechnical Testing Journal (GTJ) / Table of Contents

1990 Volume 13, Issue 1 (March 1990)

THIS ISSUE IS COMPLETE. For citation purposes, the official publication of this journal is the online version.

Geotechnical Properties of Expanded Shale Lightweight Aggregate
Valsangkar A., Holm T.
Page Count: 6
Published: 01 March 1990
Abstract
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Paper ID: GTJ10141J
DOI: 10.1520/GTJ10141J

An Automatic Feedback System for Resonant Column Testing
Morris D.
Page Count: 8
Published: 01 March 1990
Abstract
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Paper ID: GTJ10142J
DOI: 10.1520/GTJ10142J

Generalized Calibration of a Nuclear Moisture/Density Depth Gauge
Morris P., Williams D.
Page Count: 12
Published: 01 March 1990
Abstract
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Paper ID: GTJ10143J
DOI: 10.1520/GTJ10143J

Design of a Large Calibration Chamber
Sweeney B., Clough G.
Page Count: 9
Published: 01 March 1990
Abstract
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Paper ID: GTJ10144J
DOI: 10.1520/GTJ10144J

Pressuremeter Creep Testing in Ice: Calibration and Test Procedures
Kjartanson B., Shields D., Domaschuk L.
Page Count: 7
Published: 01 March 1990
Abstract
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Paper ID: GTJ10140J
DOI: 10.1520/GTJ10140J

Axial Deformation Measurement in Repeated Load Triaxial Testing
Nataatmadja A., Parkin A.
Page Count: 4
Published: 01 March 1990
Abstract
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Paper ID: GTJ10145J
DOI: 10.1520/GTJ10145J

Shear Zone Characterization in Sands by Carbowax Impregnation
Hryciw R., Irsyam M.
Page Count: 4
Published: 01 March 1990
Abstract
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Paper ID: GTJ10146J
DOI: 10.1520/GTJ10146J

Evaluation of Allowable Pressure Under Foundations
Reznik Y.
Page Count: 5
Published: 01 March 1990
Abstract
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Paper ID: GTJ10147J
DOI: 10.1520/GTJ10147J

Statistical Description of Triaxial Shear Test Results
Schoenemann M., Pyles M.
Page Count: 5
Published: 01 March 1990
Abstract
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Paper ID: GTJ10148J
DOI: 10.1520/GTJ10148J

Discussion on “The Use of Hall Effect Semiconductors in Geotechnical Instrumentation” by C. R. I. Clayton, S. A. Khatrush, A. V. D. Bica, and A. Siddique
Tatsuoka F., Shibuya S., Goto S., Sato T., Kong X.
Page Count: 5
Published: 01 March 1990
Abstract
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Paper ID: GTJ10149J
DOI: 10.1520/GTJ10149J

Closure to “Discussion on ‘The Use of Hall Effect Semiconductors in Geotechnical Instrumentation’ by F. Tatsuoka, S. Shibuya, S. Goto, T. Sato, and X. J. Kong” by C. R. I. Clayton, S. A. Khatrush, A. V. D. Bica, and A. Siddique
Clayton C., Khatrush S., Bica A., Siddique A.
Page Count: 3
Published: 01 March 1990
Abstract
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Paper ID: GTJ10150J
DOI: 10.1520/GTJ10150J

Book Review
Page Count: 1
Published: 01 March 1990
Abstract
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Paper ID: GTJ10151J
DOI: 10.1520/GTJ10151J

Miscellaneous Information
Page Count: 8
Published: 01 March 1990
Abstract
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Paper ID: GTJ10152J
DOI: 10.1520/GTJ10152J