ISSN: 1945-7545
CODEN: GTJODJ
Page Count: 5
Discussion on “The Use of Hall Effect Semiconductors in Geotechnical Instrumentation” by C. R. I. Clayton, S. A. Khatrush, A. V. D. Bica, and A. Siddique
Tatsuoka, F
Institute of Industrial Science, University of Tokyo,
Shibuya, S
Institute of Industrial Science, University of Tokyo,
Goto, S
Technology Research Center, Taisei Corp.,
Sato, T
Institute of Industrial Science, University of Tokyo,
Kong, XJ
Dailian University of Technology,
Abstract
Keywords:
instrumentation, strain, stress, calibrations, errors, triaxial tests, deformation gages, pressure cells
Paper ID: GTJ10149J
DOI: 10.1520/GTJ10149J
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Author
Title Discussion on “The Use of Hall Effect Semiconductors in Geotechnical Instrumentation” by C. R. I. Clayton, S. A. Khatrush, A. V. D. Bica, and A. Siddique
Symposium , 0000-00-00
Committee D18