RFLP Band Size Standards: NIST Standard Reference Material® 2390

    Volume 45, Issue 5 (September 2000)

    ISSN: 0022-1198

    CODEN: JFSOAD

    Page Count: 13


    Reeder, DJ
    Analytical Chemistry Division and Biotechnology Division, Chemical and Science Technology Laboratory, National Institute of Standards and Technology, Gaithersburg, MD

    Duewer, DL
    Analytical Chemistry Division and Biotechnology Division, Chemical and Science Technology Laboratory, National Institute of Standards and Technology, Gaithersburg, MD

    Richie, KL
    Analytical Chemistry Division and Biotechnology Division, Chemical and Science Technology Laboratory, National Institute of Standards and Technology, Gaithersburg, MD

    (Received 28 April 1999; accepted 15 November 1999)

    Abstract

    The procedural standard for DNA profiling developed by the U.S. advisory board on DNA quality assurance methods mandates annual confirmation of forensic DNA measurement systems against an appropriate reference material supplied by or traceable to the National Institute of Standards and Technology (NIST). NIST Standard Reference Material® (SRM®) 2390 is a suitable and appropriate standard for HaeIII restriction enzyme-based restriction fragment length polymorphism (RFLP) profiling systems. Originally issued in 1992, an among-laboratory SRM 2390 recertification study was initiated in 1997. Using data provided by the 20 state, local, or commercial forensic laboratory participants, quantitative band sizes values (expected mean values and associated bivariate tolerance intervals) are established for two different-source DNAs (female cell line K562 and healthy male “TAW”) for genetic loci D1S7, D2S44, D4S139, D5S110, D10S28, and D17S79. Methods for validating an RFLP measurement system, validating a control material or other secondary standard, and for tracing a particular set of RFLP measurements to NIST SRM 2390 are described in detail.


    Paper ID: JFS14836J

    DOI: 10.1520/JFS14836J

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    Author
    Title RFLP Band Size Standards: NIST Standard Reference Material® 2390
    Symposium , 0000-00-00
    Committee E30