Volume 45, Issue 4 (July 2000)

    Normalization of Residual Ions After Removal of the Base Peak in Electron Impact Mass Spectrometry

    (Received 23 August 1999; accepted 25 October 1999)

    CODEN: JFSOAD

      Format Pages Price  
    PDF Version 4 $25   ADD TO CART


    Abstract

    The mass spectra of compounds that produce limited detail under electron impact conditions may yield useful data for identification purposes when further examined. Through the mathematical removal of the base peak, previously noninformative ions become discriminating and useful for identification. In this work we show that this process of base peak removal and the re-normalizing of the remaining ions is reproducible under a variety of conditions and can be valuable for compound identification.


    Author Information:

    Buel, E
    Vermont Forensic Laboratory, Waterbury, VT

    Gagné, HM
    Vermont Forensic Laboratory, Waterbury, VT

    Steeves, JB
    Vermont Forensic Laboratory, Waterbury, VT


    Stock #: JFS14789J

    ISSN: 0022-1198

    DOI: 10.1520/JFS14789J

    ASTM International
    is a member of CrossRef.

    Author
    Title Normalization of Residual Ions After Removal of the Base Peak in Electron Impact Mass Spectrometry
    Symposium , 0000-00-00
    Committee E30