Volume 44, Issue 1 (January 1999)

    Applications of Focused Ion Beam Systems in Gunshot Residue Investigation

    (Received 6 January 1998; accepted 11 May 1998)

    CODEN: JFSOAD

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    Abstract

    Scanning ion microscopy technology has opened a new door to forensic scientists, allowing the GSR investigator to see inside a particle's core. Using a focused ion beam, particles can be cross-sectioned, revealing interior morphology and character that can be utilized for identification of the ammunition manufacturer.


    Author Information:

    Wenz, HW
    Forensic Scientists, Forensic Science Institute of the Bundeskriminalamt, Wiesbaden,

    Niewöhner, L
    Forensic Scientists, Forensic Science Institute of the Bundeskriminalamt, Wiesbaden,


    Stock #: JFS14419J

    ISSN: 0022-1198

    DOI: 10.1520/JFS14419J

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    Author
    Title Applications of Focused Ion Beam Systems in Gunshot Residue Investigation
    Symposium , 0000-00-00
    Committee E30