ISSN: 0022-1198
CODEN: JFSCA
Page Count: 5

Applications of Focused Ion Beam Systems in Gunshot Residue Investigation
Wenz, HW
Forensic Scientists, Forensic Science Institute of the Bundeskriminalamt,

Niewöhner, L
Forensic Scientists, Forensic Science Institute of the Bundeskriminalamt,

(Received 6 January 1998; accepted 11 May 1998)

Abstract

Scanning ion microscopy technology has opened a new door to forensic scientists, allowing the GSR investigator to see inside a particle's core. Using a focused ion beam, particles can be cross-sectioned, revealing interior morphology and character that can be utilized for identification of the ammunition manufacturer.

Keywords:
forensic science criminalistics, gunshot residue, focused ion beam, morphology, cross section

Paper ID: JFS14419J
DOI: 10.1520/JFS14419J
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