Page Count: 6
Examination of Line Crossings by Low KV Scanning Electron Microscopy (SEM) Using Photographic Stereoscopic Pairs
Examiner of Questioned Documents,
Electron Microscopist, Bacon Donaldson-Consulting Engineers,
(Received 10 March 1995; accepted 9 June 1995)
An update on the examination of the sequence of crossed lines, specifically, between ball point pen strokes (waterfast glycol and aqueous based inks) and faint typewritten impressions (produced by old, poor quality fabric ribbon), utilizing a contemporary Hitachi S-2500 SEM and photographic stereoscopic pairs.
forensic science, questioned documents, scanning electron microscopy
Paper ID: JFS13899J
Title Examination of Line Crossings by Low KV Scanning Electron Microscopy (SEM) Using Photographic Stereoscopic Pairs
Symposium , 0000-00-00
ASTM International is a member of CrossRef.