Examination of Line Crossings by Low KV Scanning Electron Microscopy (SEM) Using Photographic Stereoscopic Pairs

    Volume 41, Issue 1 (January 1996)

    ISSN: 0022-1198

    CODEN: JFSOAD

    Page Count: 6


    Blueschke, A
    Examiner of Questioned Documents, Forensic Consultants, Delta, B.C.

    Lacis, A
    Electron Microscopist, Bacon Donaldson-Consulting Engineers, Richmond, B.C.

    (Received 10 March 1995; accepted 9 June 1995)

    Abstract

    An update on the examination of the sequence of crossed lines, specifically, between ball point pen strokes (waterfast glycol and aqueous based inks) and faint typewritten impressions (produced by old, poor quality fabric ribbon), utilizing a contemporary Hitachi S-2500 SEM and photographic stereoscopic pairs.


    Paper ID: JFS13899J

    DOI: 10.1520/JFS13899J

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    Author
    Title Examination of Line Crossings by Low KV Scanning Electron Microscopy (SEM) Using Photographic Stereoscopic Pairs
    Symposium , 0000-00-00
    Committee E30