Use of a Silicon Carbide Sampling Accessory for the Diffuse Reflectance Infrared Fourier Transform Analysis of Samples of Interest to Forensic Science

    Volume 36, Issue 2 (March 1991)

    ISSN: 0022-1198

    CODEN: JFSOAD

    Page Count: 9


    Lennard, CJ
    Assistant and associate professor, Institut de Police Scientifique et de Criminologie, University of Lausanne, Lausanne, CH

    Mazzella, WD
    Assistant and associate professor, Institut de Police Scientifique et de Criminologie, University of Lausanne, Lausanne, CH

    (Received 26 February 1990; accepted 9 April 1990)

    Abstract

    An infrared spectroscopy method is described which requires little sample preparation and may be used for analysis of a wide range of samples of interest to forensic science. A small quantity of a sample is rubbed onto an abrasive silicon carbide disk, which is then measured by diffuse reflectance infrared Fourier transform spectroscopy (DRIFTS). The technique has been successfully applied to the infrared analysis of paint, synthetic rubber, cosmetics, corrector fluid, and adhesives.


    Paper ID: JFS13058J

    DOI: 10.1520/JFS13058J

    ASTM International
    is a member of CrossRef.

    Author
    Title Use of a Silicon Carbide Sampling Accessory for the Diffuse Reflectance Infrared Fourier Transform Analysis of Samples of Interest to Forensic Science
    Symposium , 0000-00-00
    Committee E30