ISSN: 0022-1198
CODEN: JFSCA
Page Count: 9

Use of a Silicon Carbide Sampling Accessory for the Diffuse Reflectance Infrared Fourier Transform Analysis of Samples of Interest to Forensic Science
Lennard, CJ
Assistant and associate professor, Institut de Police Scientifique et de Criminologie, University of Lausanne, CH

Mazzella, WD
Assistant and associate professor, Institut de Police Scientifique et de Criminologie, University of Lausanne, CH

(Received 26 February 1990; accepted 9 April 1990)

Abstract

An infrared spectroscopy method is described which requires little sample preparation and may be used for analysis of a wide range of samples of interest to forensic science. A small quantity of a sample is rubbed onto an abrasive silicon carbide disk, which is then measured by diffuse reflectance infrared Fourier transform spectroscopy (DRIFTS). The technique has been successfully applied to the infrared analysis of paint, synthetic rubber, cosmetics, corrector fluid, and adhesives.

Keywords:
criminalistics, spectroscopic analysis, diffuse reflectance infrared Fourier transform spectroscopy (DRIFTS), infrared spectroscopy, Fourier transform infrared (FTIR) spectroscopy, Fourier transform, diffuse reflectance, silicon carbide paper

Paper ID: JFS13058J
DOI: 10.1520/JFS13058J
ASTM International is a member of CrossRef.