Volume 36, Issue 2 (March 1991)

    Evaluation of Instrumental Parameters for Automated Scanning Electron Microscopy/Gunshot Residue Particle Analysis

    (Received 26 March 1990; accepted 5 June 1990)

    CODEN: JFSOAD

      Format Pages Price  
    PDF Version 12 $25   ADD TO CART


    Abstract

    Computer-controlled analytical scanning electron microscope (SEM) parameters such as the minimum particle size, video threshold, digital clectron beam point spacing, video dwell time, X-ray counting time, and analysis mode, affect the time and accuracy of automated gunshot residue (GSR) particle analysis. The effects of these parameters on automated analysis of a GSR sample are described. This study was performed using custom-written software which includes several features, such as simultaneous energy and wavelength-dispersive X-ray analysis, that are not available in commercial packages.

    Proper setting of the backscattered electron (BSE) video threshold is critical for automated SEM/GSR particle analysis. Use of a calibrated BSE detector facilitates reproducible setting of the BSE video threshold.

    With the results from this and similar studies using different GSR samples, it should be possible to develop standard procedures for automated SEM/GSR particle analysis.


    Author Information:

    Germani, MS
    Senior research scientist, McCrone Associates, Westmont, IL


    Stock #: JFS13035J

    ISSN: 0022-1198

    DOI: 10.1520/JFS13035J

    ASTM International
    is a member of CrossRef.

    Author
    Title Evaluation of Instrumental Parameters for Automated Scanning Electron Microscopy/Gunshot Residue Particle Analysis
    Symposium , 0000-00-00
    Committee E30