Use of Scanning Electron Microscopy (SEM) to Identify Cuts and Tears in a Nylon Fabric

    Volume 35, Issue 4 (July 1990)

    ISSN: 0022-1198

    CODEN: JFSOAD

    Page Count: 4


    Card, KA
    Technical Officer, Electron Microscopy Section, Physics and Engineering Laboratory, Department of Scientific and Industrial Research, Petone,

    Stowell, LI
    Forensic biologist, Criminalistics and Forensic and Biology Section, Chemistry Division, Department of Scientific and Industrial Research, Petone,

    (Received 8 July 1989; accepted 30 August 1989)

    Abstract

    Scanning electron microscopy (SEM) micrographs were obtained for fiber ends of a nylon fabric which had been experimentally cut with a scalpel or scissors, or torn by force. In the nylon fabric used, these three types of damage were identifiable on the basis of features of the fiber ends.


    Paper ID: JFS12908J

    DOI: 10.1520/JFS12908J

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    Title Use of Scanning Electron Microscopy (SEM) to Identify Cuts and Tears in a Nylon Fabric
    Symposium , 0000-00-00
    Committee E30