ISSN: 0022-1198
CODEN: JFSCA
Page Count: 4

Use of Scanning Electron Microscopy (SEM) to Identify Cuts and Tears in a Nylon Fabric
Card, KA
Technical Officer, Electron Microscopy Section, Physics and Engineering Laboratory, Department of Scientific and Industrial Research,

Stowell, LI
Forensic biologist, Criminalistics and Forensic and Biology Section, Chemistry Division, Department of Scientific and Industrial Research,

(Received 8 July 1989; accepted 30 August 1989)

Abstract

Scanning electron microscopy (SEM) micrographs were obtained for fiber ends of a nylon fabric which had been experimentally cut with a scalpel or scissors, or torn by force. In the nylon fabric used, these three types of damage were identifiable on the basis of features of the fiber ends.

Keywords:
criminalistics, fabrics, clothing damage, scanning electron microscopy (SEM), cuts and tears, fiber end surfaces, nylon, textiles

Paper ID: JFS12908J
DOI: 10.1520/JFS12908J
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