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Use of Scanning Electron Microscopy (SEM) to Identify Cuts and Tears in a Nylon Fabric
Electron Microscopy Section, Physics and Engineering Laboratory, Department of Scientific and Industrial Research,
Criminalistics and Forensic and Biology Section, Chemistry Division, Department of Scientific and Industrial Research,
(Received 8 July 1989; accepted 30 August 1989)
Scanning electron microscopy (SEM) micrographs were obtained for fiber ends of a nylon fabric which had been experimentally cut with a scalpel or scissors, or torn by force. In the nylon fabric used, these three types of damage were identifiable on the basis of features of the fiber ends.
criminalistics, fabrics, clothing damage, scanning electron microscopy (SEM), cuts and tears, fiber end surfaces, nylon, textiles
Paper ID: JFS12908J
Title Use of Scanning Electron Microscopy (SEM) to Identify Cuts and Tears in a Nylon Fabric
Symposium , 0000-00-00
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