Volume 32, Issue 3 (May 1987)

    Investigation of Gunshot Residues by Means of Auger Electron Spectroscopy

    (Received 17 May 1986; accepted 28 July 1986)

    CODEN: JFSOAD

      Format Pages Price  
    PDF Version 14 $25   ADD TO CART


    Abstract

    In the past years, scanning electron microscopy (SEM) coupled with energy dispersive X-ray analysis (EDX) has displayed many advantages over established methods such as optical emission spectroscopy (OES), atomic absorption spectroscopy (AAS), and neutron activation analysis (NAA) for the investigation of gunshot residues (GSR). In a research project, Auger electron spectroscopy was used instead of EDX. This method makes possible analyses of the chemical elements with superior lateral resolution. Furthermore, elements with low mass numbers and elements whose peaks overlap at EDX can be measured. In addition, sputtering equipment depth profiles can be established. Our experiments demonstrate the potential of Auger electron spectroscopy for the investigation of GSR. Also, they produced many details on GSR from various ammunition.


    Author Information:

    Hellmiss, G
    Head of physics section and forensic scientist, Forensic Science Institute of the Bundeskriminalamt, Wiesbaden,

    Weiss, M
    Senior laboratory scientist, Perkin-Elmer Verkauf GmbH, Physical Electronics Division, Vaterstetten,

    Lichtenberg, W
    Head of physics section and forensic scientist, Forensic Science Institute of the Bundeskriminalamt, Wiesbaden,


    Stock #: JFS12381J

    ISSN: 0022-1198

    DOI: 10.1520/JFS12381J

    ASTM International
    is a member of CrossRef.

    Author
    Title Investigation of Gunshot Residues by Means of Auger Electron Spectroscopy
    Symposium , 0000-00-00
    Committee E30