ISSN: 0022-1198
CODEN: JFSCA
Published Online: 1 April 1982
Page Count: 10

Application of Proton-Induced X-Ray Emission Technique to Gunshot Residue Analyses
Mehta, GK
Postdoctoral fellow, assistant professor, and professor, Indian Institute of Technology,

Varier, KM
Postdoctoral fellow, assistant professor, and professor, Indian Institute of Technology,

Rao, MS
Scientific officer, District Forensic Science Laboratory,

Panigrahi, N
Assistant professor and doctoral fellow, Institute of Physics, OH

Sen, P
Assistant professor and doctoral fellow, Institute of Physics, OH

Sen, S
Postdoctoral fellow, assistant professor, and professor, Indian Institute of Technology,

(Received 5 August 1981; accepted 23 October 1981)

Abstract

The proton-induced X-ray emission (PIXE) technique was applied to the identification and analysis of gunshot residues. Studies were made of the type of bullet and bullet hole identification, firearm discharge element profiles, the effect of various target backings, and hand swabbings. The discussion of the results reviews the sensitivity of the PIXE technique, its nondestructive nature, and its role in determining the distance from the gun to the victim and identifying the type of bullet used and whether a wound was made by a bullet or not. The high sensitivity of the PIXE technique, which is able to analyze samples as small as 0.1 to 1 ng, and its usefulness for detecting a variety of elements should make it particularly useful in firearms residue investigations.

Keywords:
criminalistics, gunshot residues, radiography

Paper ID: JFS11487J
DOI: 10.1520/JFS11487J
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