Volume 25, Issue 3 (July 1980)

    A Method for Recording X-Ray Diffraction Patterns for Trace Quantities of Crystalline Materials

    (Received 30 November 1979; accepted 14 January 1980)

    Published Online: July

    CODEN: JFSOAD

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    Abstract

    A procedure has been developed for recording diffraction patterns of small amounts of material and has been applied to the identification of silicon carbide in lubricating oil. To use this technique for the identification of material, the sample must be crystalline and the constituent of interest must be present in 1% or greater concentration.


    Author Information:

    Howell, GR
    Criminalist, Regional Criminalistics Laboratory, Independence, Mo

    Lott, PF
    Chemists, University of Missouri, Kansas City,

    Foster, RL
    Chemists, University of Missouri, Kansas City,


    Stock #: JFS11272J

    ISSN: 0022-1198

    DOI: 10.1520/JFS11272J

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    Author
    Title A Method for Recording X-Ray Diffraction Patterns for Trace Quantities of Crystalline Materials
    Symposium , 0000-00-00
    Committee E30