A Method for Recording X-Ray Diffraction Patterns for Trace Quantities of Crystalline Materials

    Volume 25, Issue 3 (July 1980)

    ISSN: 0022-1198

    CODEN: JFSOAD

    Published Online: 1 July 1980

    Page Count: 4


    Howell, GR
    Criminalist, Regional Criminalistics Laboratory, Independence, Mo

    Lott, PF
    Chemists, University of Missouri, Kansas City,

    Foster, RL
    Chemists, University of Missouri, Kansas City,

    (Received 30 November 1979; accepted 14 January 1980)

    Abstract

    A procedure has been developed for recording diffraction patterns of small amounts of material and has been applied to the identification of silicon carbide in lubricating oil. To use this technique for the identification of material, the sample must be crystalline and the constituent of interest must be present in 1% or greater concentration.


    Paper ID: JFS11272J

    DOI: 10.1520/JFS11272J

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    Title A Method for Recording X-Ray Diffraction Patterns for Trace Quantities of Crystalline Materials
    Symposium , 0000-00-00
    Committee E30