SEM Microstriation Characterization of Bullets and Contaminant Particle Identification

    Volume 19, Issue 4 (October 1974)

    ISSN: 0022-1198

    CODEN: JFSOAD

    Published Online: 1 October 1974

    Page Count: 14


    Judd, G
    Associate professor, Rensselaer Polytechnic Institute, Troy, N.Y.

    Sabo, J
    Electron microscopist, New York State Police Scientific Laboratory, Albany, N.Y.

    Horn, R
    Lieutenant and assistant director, New York State Police, Scientific Laboratory, Albany, N.Y.

    Ferriss, S
    Captain and director, New York State Police Scientific Laboratory, Albany, N.Y.

    Hamilton, W
    Research scientist, Litton Bioneties, Kensington, Md.

    (Received 5 February 1974; accepted 22 April 1974)

    Abstract

    Recent applications of the scanning electron microscope (SEM) have been in areas such as paint samples evaluation [1,2] and firing pin impressions [3,4], These have provided useful additional information to the forensic scientist. This investigation was conducted to further expand the applicability of the SEM and the developed imaging techniques for use on other forms of physical evidence. Specifically, striations on copper-jacketed bullets and contaminant particles recovered from personal articles (clothing, shoes, etc) were chosen.


    Paper ID: JFS10470J

    DOI: 10.1520/JFS10470J

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    Author
    Title SEM Microstriation Characterization of Bullets and Contaminant Particle Identification
    Symposium , 0000-00-00
    Committee E30