Published Online: 1 October 1974
Page Count: 14
Associate professor, Rensselaer Polytechnic Institute, Troy, N.Y.
Electron microscopist, New York State Police Scientific Laboratory, Albany, N.Y.
Lieutenant and assistant director, New York State Police, Scientific Laboratory, Albany, N.Y.
Captain and director, New York State Police Scientific Laboratory, Albany, N.Y.
Research scientist, Litton Bioneties, Kensington, Md.
(Received 5 February 1974; accepted 22 April 1974)
Recent applications of the scanning electron microscope (SEM) have been in areas such as paint samples evaluation [1,2] and firing pin impressions [3,4], These have provided useful additional information to the forensic scientist. This investigation was conducted to further expand the applicability of the SEM and the developed imaging techniques for use on other forms of physical evidence. Specifically, striations on copper-jacketed bullets and contaminant particles recovered from personal articles (clothing, shoes, etc) were chosen.
Paper ID: JFS10470J