Journal Published Online: 01 October 1974
Volume 19, Issue 4

SEM Microstriation Characterization of Bullets and Contaminant Particle Identification

CODEN: JFSCAS

Abstract

Recent applications of the scanning electron microscope (SEM) have been in areas such as paint samples evaluation [1,2] and firing pin impressions [3,4], These have provided useful additional information to the forensic scientist. This investigation was conducted to further expand the applicability of the SEM and the developed imaging techniques for use on other forms of physical evidence. Specifically, striations on copper-jacketed bullets and contaminant particles recovered from personal articles (clothing, shoes, etc) were chosen.

Author Information

Judd, G
Rensselaer Polytechnic Institute, Troy, N.Y.
Sabo, J
New York State Police Scientific Laboratory, Albany, N.Y.
Hamilton, W
Litton Bioneties, Kensington, Md.
Ferriss, S
New York State Police Scientific Laboratory, Albany, N.Y.
Horn, R
New York State Police, Scientific Laboratory, Albany, N.Y.
Pages: 14
Price: $25.00
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Stock #: JFS10470J
ISSN: 0022-1198
DOI: 10.1520/JFS10470J