Volume 19, Issue 4 (October 1974)

    SEM Microstriation Characterization of Bullets and Contaminant Particle Identification

    (Received 5 February 1974; accepted 22 April 1974)

    Published Online: October

    CODEN: JFSOAD

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    Abstract

    Recent applications of the scanning electron microscope (SEM) have been in areas such as paint samples evaluation [1,2] and firing pin impressions [3,4], These have provided useful additional information to the forensic scientist. This investigation was conducted to further expand the applicability of the SEM and the developed imaging techniques for use on other forms of physical evidence. Specifically, striations on copper-jacketed bullets and contaminant particles recovered from personal articles (clothing, shoes, etc) were chosen.


    Author Information:

    Judd, G
    Associate professor, Rensselaer Polytechnic Institute, Troy, N.Y.

    Sabo, J
    Electron microscopist, New York State Police Scientific Laboratory, Albany, N.Y.

    Horn, R
    Lieutenant and assistant director, New York State Police, Scientific Laboratory, Albany, N.Y.

    Ferriss, S
    Captain and director, New York State Police Scientific Laboratory, Albany, N.Y.

    Hamilton, W
    Research scientist, Litton Bioneties, Kensington, Md.


    Stock #: JFS10470J

    ISSN: 0022-1198

    DOI: 10.1520/JFS10470J

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    Author
    Title SEM Microstriation Characterization of Bullets and Contaminant Particle Identification
    Symposium , 0000-00-00
    Committee E30