Volume 19, Issue 2 (April 1974)

    Characterization of Paint Fragments by Combined Topographical and Chemical Electron Optics Techniques

    (Received 8 February 1973; accepted 16 July 1973)

    Published Online: April

    CODEN: JFSOAD

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    Abstract

    Automotive paint fragments are one type of physical evidence material which has been examined by scanning electron microscopy (SEM) and energy dispersive X-ray analysis (EDS) [1,2]. The SEM-EDS can add to the information which can be obtained from a paint sample because the paint contains both topographical features and chemical composition data. Previous research has been undertaken to try to understand the nature of the variables involved and the criteria of data evaluation [1–4]. While these studies showed the applicability of the SEM to the forensic science analysis of paint fragments, the questions of reproducibility of the data obtained and of reliability as an identifying technique were not definitively answered.


    Author Information:

    Judd, G
    Graduate student and associate professor, Rensselaer Polytechnic Institute, Troy, N.Y.

    Wilson, R
    Graduate student and associate professor, Rensselaer Polytechnic Institute, Troy, N.Y.

    Ferriss, S
    Captain and director of the Scientific Laboratory, New York State Police, Albany, N.Y.


    Stock #: JFS10184J

    ISSN: 0022-1198

    DOI: 10.1520/JFS10184J

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    Author
    Title Characterization of Paint Fragments by Combined Topographical and Chemical Electron Optics Techniques
    Symposium , 0000-00-00
    Committee E30