ISSN: 0022-1198
CODEN: JFSCA
Published Online: 1 April 1974
Page Count: 9

Characterization of Paint Fragments by Combined Topographical and Chemical Electron Optics Techniques
Judd, G
Graduate student and associate professor, Rensselaer Polytechnic Institute, N.Y.

Wilson, R
Graduate student and associate professor, Rensselaer Polytechnic Institute, N.Y.

Ferriss, S
Captain and director of the Scientific Laboratory, New York State Police, N.Y.

(Received 8 February 1973; accepted 16 July 1973)

Abstract

Automotive paint fragments are one type of physical evidence material which has been examined by scanning electron microscopy (SEM) and energy dispersive X-ray analysis (EDS) [1,2]. The SEM-EDS can add to the information which can be obtained from a paint sample because the paint contains both topographical features and chemical composition data. Previous research has been undertaken to try to understand the nature of the variables involved and the criteria of data evaluation [1–4]. While these studies showed the applicability of the SEM to the forensic science analysis of paint fragments, the questions of reproducibility of the data obtained and of reliability as an identifying technique were not definitively answered.

Keywords:

Paper ID: JFS10184J
DOI: 10.1520/JFS10184J
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