Characterization of Paint Fragments by Combined Topographical and Chemical Electron Optics Techniques

    Volume 19, Issue 2 (April 1974)

    ISSN: 0022-1198

    CODEN: JFSOAD

    Published Online: 1 April 1974

    Page Count: 9


    Judd, G
    Graduate student and associate professor, Rensselaer Polytechnic Institute, Troy, N.Y.

    Wilson, R
    Graduate student and associate professor, Rensselaer Polytechnic Institute, Troy, N.Y.

    Ferriss, S
    Captain and director of the Scientific Laboratory, New York State Police, Albany, N.Y.

    (Received 8 February 1973; accepted 16 July 1973)

    Abstract

    Automotive paint fragments are one type of physical evidence material which has been examined by scanning electron microscopy (SEM) and energy dispersive X-ray analysis (EDS) [1,2]. The SEM-EDS can add to the information which can be obtained from a paint sample because the paint contains both topographical features and chemical composition data. Previous research has been undertaken to try to understand the nature of the variables involved and the criteria of data evaluation [1–4]. While these studies showed the applicability of the SEM to the forensic science analysis of paint fragments, the questions of reproducibility of the data obtained and of reliability as an identifying technique were not definitively answered.


    Paper ID: JFS10184J

    DOI: 10.1520/JFS10184J

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    Author
    Title Characterization of Paint Fragments by Combined Topographical and Chemical Electron Optics Techniques
    Symposium , 0000-00-00
    Committee E30