Volume 24, Issue 4 (December 2002)

    Deflection Measurements of Laminated Thin Plates Using Electronic Speckle Pattern Interferometry

    (Received 11 January 2002; accepted 4 June 2002)

    CODEN: CTROAD

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    Abstract

    An adaptive Electronic speckle Pattern Interferometry (ESPI) system has been developed to measure out-of-plane deformation of laminates subjected to quasi-static loads. The system was installed and setup for calibration with aluminum specimens mounted to an optical breadboard. Several parameters of the test fixture and system's geometry needed to be adjusted before usable fringe patterns were obtained, and the system's resolution and range were determined. The ESPI system was then reconfigured for use with composite specimens subjected to quasi-static loading. Results of fringe patterns, calibration curves and deformation patterns are presented for A1 and graphite/epoxy specimens. The ESPI resolution was estimated at 25 μm per fringe for the A1 surface, and 11 μm per fringe for the composite laminate. From the results, it can be concluded that the usable deflection range is limited at high system resolutions.


    Author Information:

    Pelegri, AA
    Mechanical and Aerospace Engineering, Rutgers, The State University of New Jersey, Piscataway, NJ

    Golda, D
    Mechanical and Aerospace Engineering, Rutgers, The State University of New Jersey, Piscataway, NJ

    Kedlaya, D
    Mechanical and Aerospace Engineering, Rutgers, The State University of New Jersey, Piscataway, NJ


    Stock #: CTR10927J

    ISSN: 0884-6804

    DOI: 10.1520/CTR10927J

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    Author
    Title Deflection Measurements of Laminated Thin Plates Using Electronic Speckle Pattern Interferometry
    Symposium , 0000-00-00
    Committee D30