Journal Published Online: 01 December 2002
Volume 24, Issue 4

Deflection Measurements of Laminated Thin Plates Using Electronic Speckle Pattern Interferometry

CODEN: JCTRER

Abstract

An adaptive Electronic speckle Pattern Interferometry (ESPI) system has been developed to measure out-of-plane deformation of laminates subjected to quasi-static loads. The system was installed and setup for calibration with aluminum specimens mounted to an optical breadboard. Several parameters of the test fixture and system's geometry needed to be adjusted before usable fringe patterns were obtained, and the system's resolution and range were determined. The ESPI system was then reconfigured for use with composite specimens subjected to quasi-static loading. Results of fringe patterns, calibration curves and deformation patterns are presented for A1 and graphite/epoxy specimens. The ESPI resolution was estimated at 25 μm per fringe for the A1 surface, and 11 μm per fringe for the composite laminate. From the results, it can be concluded that the usable deflection range is limited at high system resolutions.

Author Information

Golda, D
Mechanical and Aerospace Engineering, Rutgers, The State University of New Jersey, Piscataway, NJ
Kedlaya, D
Mechanical and Aerospace Engineering, Rutgers, The State University of New Jersey, Piscataway, NJ
Pelegri, AA
Mechanical and Aerospace Engineering, Rutgers, The State University of New Jersey, Piscataway, NJ
Pages: 9
Price: $25.00
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Stock #: CTR10927J
ISSN: 0884-6804
DOI: 10.1520/CTR10927J