ASTM WK45191

    Revision of E1181 - 02(2008) Standard Test Methods for Characterizing Duplex Grain Sizes

    (What is a Work Item?)

    Active Standard: E1181 - 02(2008)

    Developed by Subcommittee: E04.08 | Committee E04 | Contact Staff Manager



    WK45191

    1. Rationale

    To reduce the uncertainty on how to rate the grain structure when the grain size may differ by 3 to 4 ASTM numbers AND is not an ALA condition.


    Keywords

    area fraction; banding; bands; duplex; grain size; necklace; Alloys; Area fractions; Banding; Bimodal distribution; Comparison techniques; Crystal lattice structure; Distribution; Duplex grain structures; Etching (materials/process); Grain size; Image analysis--metals/metallic materials; Isolated coarse grains; Log-normal distribution; Magnification; Mechanical properties; Metals and metallic materials; Microscopic examination--metals/alloys; Necklace structure; Photomicrography; Planimetric procedure; Point count; Random duplex grain size; Structural metals/alloys; Surface analysis--metals/alloys; Thermomechanical control process (TMCP); Topological analysis; Visual examination--metals/alloys;
    Citing ASTM Standards
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    Work Item Status

    Date Initiated:
    02-24-2014

    Technical Contact:
    John Chir

    Item:
    003

    Ballot:
    E04 (14-01)

    Status:
    Negative Votes Need Resolution