This guide establishes a standard method for the preparation of stabilized metal particle samples, which are solely or predominantly sub-100 nm, for electron microscopy to allow for accurate and reproducible measurement of particle size. Specifically, it provides a general overview to the use of functionalized substrates for the microscopy of metal particles that are suspended, dissolved, or otherwise dispersed in aqueous solvent and have a positive or negative surface charge. Examples of such materials include citrate-stabilized (negative) gold or silver nanoparticles, polyvinylpyrrolidone-stabilized (negative) metal particles, or poly-l-lysine-stabilized (positive) particles.
No existing standard in this area.
KeywordsParticle size distribution, electron microscopy, sample preparation, particle characterization
The title and scope are in draft form and are under development within this ASTM Committee.Back to Top
Draft Under Development