1. Rationale
E1508 was recently successfully balloted with changes to add references to silicon drift detectors. As a consequence of that ballot, various editorial and minor comments were received. Also received was a suggestion to add a qualitative analysis section to the standard guide. Inasmuch as the elements present must be identified before they can be quantified, the suggestion to add a qualitative analysis section seems warranted. I have added such a section and addressed many of the other comments in the attached new draft for discussion and ballot. Additions are in blue.
Keywords
EDS; elemental analysis; energy-dispersive spectroscopy; light element; matrix correction; microanalysis; phi-rho-z; quantitative analysis; spectrum; standardless analysis; standards; X ray; X-ray microanalysis; ZAF ^INDEX TERMS: EPMA (electron probe microanalyzer); Light element; Matrix correction; Phi-rho-z; Quantitative analysis/measurement; Scanning electron microscope (SEM); Spectrochemical analysis; Spectroscopy; Spectrum; Standardless analysis; X-ray microanalysis; Elemental analysis; Energy-dispersive spectroscopy (EDS);
Citing ASTM Standards
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