Recently updated and passed, but John Grant suggested updating to include other instrument types. John Grant agreed to be technical chair.
aperture; auger electron spectroscopy (AES); knife-edge experiments; sharp edge; specimen area; spectrometer; surface analysis; X-ray photoelectron spectroscopy (XPS); Absorbed current; Absorption--spectrochemical instrumentation; Auger electron spectroscopy (AES); Computer programs; Current measurement; Deflection; Detectors; Elastic peak analysis; Line scan; Oscilloscope; Programmable power supplies; Raster scan; Scanning; Signal detection/amplification/measurement; Specimen area; Spectrometry; Surface analysis--spectrochemical analysis; Topography; Voltage; Waveforms; X-ray photoelectron spectroscopy (XPS);
Citing ASTM Standards
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