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ASTM WK37973

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Work Item: ASTM WK37973 - Revision of D5796 - 10Standard Test Method for Measurement of Dry Film Thickness of Thin Film Coil-Coated Systems by Destructive Means Using a Boring Device


Active Standard: D5796-10

Developed by Subcommittee: D01.53 | Committee D01 Home | Contact Staff Manager



1. Rationale

Challenges with dry film thickness (DFT) measurement precision in the coil industry are well known. One of the influences on measurement precision is substrate profile (roughness.) Techniques are available to measure the substrate profile and relate it to the variation in DFT measurements. The data for substrate roughness on common coil-coated metals would be collected and provided to users in the form of an Appendix to standard D5796. This information would be useful for interpretation of DFT precision. Update 5/15/13 - currently waiting for laser profile data on bare substrates.

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Citing ASTM Standards

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Work Item Status:
Date Initiated: 06-16-2012
Technical Contact: Ted Best

Status: Draft Under Development

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