Challenges with dry film thickness (DFT) measurement precision in the coil industry are well known. One of the influences on measurement precision is substrate profile (roughness.) Techniques are available to measure the substrate profile and relate it to the variation in DFT measurements. The data for substrate roughness on common coil-coated metals would be collected and provided to users in the form of an Appendix to standard D5796. This information would be useful for interpretation of DFT precision. Update 5/15/13 - currently waiting for laser profile data on bare substrates.
Citing ASTM Standards
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