1. Rationale
Up for review in review cycle.
Keywords
digital integrated circuits; digital IC's; functional errors; ionizing; pulsed radiation; radiation; transient radiation; upset threshold; Combinational logic; Destructive testing--semiconductors; Digital integrated circuits; Electrical conductors (semiconductors); Failure end point--electronic components/devices; 0Functional errors; Integrated circuits; Ionizing radiation; Irradiance/irradiation--semiconductors; 0Microelectronic devices; MSI integrated circuits; Output transient voltage; Pulsed radiation; Radiation 0exposure--electronic components/devices; Response factors; SSI integrated circuits; Threshold 0detectors; Topological analysis; Transient radiation upset threshold testing; Upset threshold; Voltage; 0Combinational logic; Destructive testing--semiconductors; Digital integrated circuits; Electrical 0conductors (semiconductors); Failure end point--electronic components/devices; Functional errors; 0Integrated circuits; Ionizing radiation; Irradiance/irradiation--semiconductors; Microelectronic devices; 0MSI integrated circuits; Output transient voltage; Pulsed radiation; Radiation exposure--electronic 0components/devices; Response factors; SSI integrated circuits; Threshold detectors; Topological 0analysis; Transient radiation upset threshold testing; Upset threshold; Voltage; ICS Number Code 031.200
Citing ASTM Standards
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