ASTM WK37055

    Work Item: ASTM WK37055 - Revision of F1262M - 95(2008) Standard Guide for Transient Radiation Upset Threshold Testing of Digital Integrated Circuits (Metric)

    (What is a Work Item?)

    Active Standard: F1262M - 95(2008)

    Developed by Subcommittee: F01.11 | Committee F01 | Contact Staff Manager



    1. Rationale

    Responce to ballot (affirmative with comment)


    Keywords

    digital integrated circuits; digital IC's; functional errors; ionizing; pulsed radiation; radiation; transient radiation; upset threshold; Combinational logic; Destructive testing--semiconductors; Digital integrated circuits; Electrical conductors (semiconductors); Failure end point--electronic components/devices; 0Functional errors; Integrated circuits; Ionizing radiation; Irradiance/irradiation--semiconductors; 0Microelectronic devices; MSI integrated circuits; Output transient voltage; Pulsed radiation; Radiation 0exposure--electronic components/devices; Response factors; SSI integrated circuits; Threshold 0detectors; Topological analysis; Transient radiation upset threshold testing; Upset threshold; Voltage; 0Combinational logic; Destructive testing--semiconductors; Digital integrated circuits; Electrical 0conductors (semiconductors); Failure end point--electronic components/devices; Functional errors; 0Integrated circuits; Ionizing radiation; Irradiance/irradiation--semiconductors; Microelectronic devices; 0MSI integrated circuits; Output transient voltage; Pulsed radiation; Radiation exposure--electronic 0components/devices; Response factors; SSI integrated circuits; Threshold detectors; Topological 0analysis; Transient radiation upset threshold testing; Upset threshold; Voltage; ICS Number Code 031.200
    Citing ASTM Standards
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    Work Item Status

    Date Initiated:
    03-30-2012

    Technical Contact:
    Mark Savage

    Item:
    005

    Ballot:
    F01 (14-01)

    Status:
    In Balloting