WK37031 Revision of F615M - 95(2008) Standard Practice for Determining Safe Current Pulse-Operating Regions for Metallization on Semiconductor Components (Metric)

1. Rationale

Item up for review on review cycle.

Keywords

current pulse; current pulse burnout; metallization burnout; safe current pulse; semiconductor burnout; Burnout resistance; Current measurement--semiconductors; Current pulse burnout; Destructive testing--semiconductors; Electrical conductors (semiconductors); Electrical resistance/resistivity--semiconductors; Metallization burnout; Pulse testing; Rectangular current test pulse application; Safe current pulse; Semiconductor burnout; Silicon semiconductors

Citing ASTM Standards

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ASTM WK37031

Work Item: ASTM WK37031 - Revision of F615M - 95(2008) Standard Practice for Determining Safe Current Pulse-Operating Regions for Metallization on Semiconductor Components (Metric)