1. Rationale
This test method requires revision to reflect current industry practice for detection of hydrophobic surface films on production hardware surfaces and to add information on the relationship between observations of water-breaks, observations of water droplets applied by atomizer, and contact angle measurements. Also, the use of mica blanks will be moved to an appendix as this method is no longer in common practice.
Keywords
atomizer test; contamination-semiconductors; film-electrical conductors; hydrophobic surface films; detection of hydrophobic organic contaminants on surface films, surface analysis-electronic components/devices; water-film test (for detecting hydrophobic contaminants), by atomizer; water-film test; hydrophobic surface films;
Citing ASTM Standards
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