ASTM WK30641

    Work Item: ASTM WK30641 - Revision of F528 - 99(2005) Standard Test Method of Measurement of Common-Emitter D-C Current Gain of Junction Transistors

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    Developed by Subcommittee: F01.11 | Committee F01 | Contact Staff Manager

    1. Rationale

    Remove this document from publication and from F1.11.


    common-emitter d-c current gain; current gain; hFE; junction transistors; transistor test;
    Citing ASTM Standards
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    Work Item Status

    Date Initiated:

    Technical Contact:
    Lydell Evans

    Draft Under Development