1. Scope
1.1 This guide is an outline of methods for scanning electron microscopy (SEM) intended for use by forensic paint examiners. 1.2 This guide is intended to supplement information presented in Guide E 1610. 1.3 The methods used by each examiner or laboratory or both depend upon sample size, sample suitability, and laboratory equipment. 1.4 The term scanning electron microscopy occasionally refers to the entire analytical system including energy dispersive X-ray spectrometry (EDX) or wavelength dispersive X-ray spectrometry (WDS) or both. 1.5 This guide does not cover the theoretical aspects of many of the topics presented. 1.6 The values given in SI units are to be considered as the standard. 1.7 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.
Keywords
dispersive X-ray spectrometry; EDX; embedment; forensic paint examination; scanning electron microscopy; SEM
The title and scope are in draft form and are under development within this ASTM Committee.
Citing ASTM Standards
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