ASTM WK24714

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Work Item: ASTM WK24714 - Revision of F980M - 96(2003) Standard Guide for Measurement of Rapid Annealing of Neutron-Induced Displacement Damage in Silicon Semiconductor Devices [Metric]

Active Standard: F980M - 96(2003)

Developed by Subcommittee: F01.11 | Committee F01 Home | Contact Staff Manager

1. Rationale

This standard is up for its 5 year cycle review. Relevant information might need to be added or removed, depending on need.

Keywords

annealing factor; displacement damage; integrated circuits; neutron damage; neutron degradation; rapid annealing; semiconductor devices

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Work Item Status:
Date Initiated:06-24-2009
Technical Contact: Lydell Evans

Status: Draft Under Development

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