1. Scope
Analysis of metallic and non-metallic impurities in graphite and carbon materials.
Today, both ICP OES and ETV-ICP OES are well established methods for the analysis of graphite. However, there is no ASTM standard available which covers the determination of trace elements in graphite by these methods. For various fields of application (e.g. nuclear and semiconductor industry) the knowledge of the concentration of impurities is mandatory. The standard will be used for production and quality control. It is also a reference standard for material qualification and the ASTM standards are recognized by regulating authorities. The keyusers will be graphite manufacturers and graphite users (incoming inspection).
Keywords
ICP OES; ETV-ICP OES; trace elements; trace analysis; carbon; graphite
The title and scope are in draft form and are under development within this ASTM Committee.
Citing ASTM Standards
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