Analysis of metallic and non-metallic impurities in graphite and carbon materials.
Today, ETV-ICP OES is a well established method for the measurement of metallic and non-metallic impurities in carbon and graphite materials. However, there is no ASTM standard test method available for this analysis method. For various fields of application (e.g. nuclear and semiconductor industry) the knowledge of the concentration of impurities is mandatory. The standard test method will be used for production and quality control. The keyusers will be graphite manufacturers and graphite users (incoming inspection).
KeywordsETV-ICP OES; trace elements; trace analysis; carbon; graphite
The title and scope are in draft form and are under development within this ASTM Committee.Back to Top
Draft Under Development