Standard Withdrawn, No replacement   Last Updated: Aug 16, 2017 Track Document
ASTM F947-85(1996)

Standard Test Method for Determining Low-Level X-Radiation Sensitivity of Photographic Films (Withdrawn 2005)

Standard Test Method for Determining Low-Level X-Radiation Sensitivity of Photographic Films (Withdrawn 2005) F0947-85R96 ASTM|F0947-85R96|en-US Standard Test Method for Determining Low-Level X-Radiation Sensitivity of Photographic Films (Withdrawn 2005) Standard new BOS Vol. 15.08 Committee F12
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Scope

1.1 This test method is for determining the maximum x-ray sensitivity coefficient (slope of diffuse visual density versus x-ray exposure) of film/processing combinations for low quantities of x-ray exposure to silver halide photographic film. This coefficient can be used to assess the relative susceptibility of films to damage from x-ray exposure, such as that encountered in airport and similar security screening systems.

1.2 This standard may involve hazardous materials, operations, and equipment. This standard does not purport to address all of the safety problems associated with its use. It is the responsibility of whoever uses this standard to consult and establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.

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