Standard Withdrawn, No replacement   Last Updated: Feb 18, 2021 Track Document
ASTM F466-79(1992)

Test Method for Small-Signal Scattering Parameters of Low-Power Transistors in the 0.2 to 2.0 GHZ Frequency Range (Withdrawn 1997)

Test Method for Small-Signal Scattering Parameters of Low-Power Transistors in the 0.2 to 2.0 GHZ Frequency Range (Withdrawn 1997) F0466-79R92 ASTM|F0466-79R92|en-US Test Method for Small-Signal Scattering Parameters of Low-Power Transistors in the 0.2 to 2.0 GHZ Frequency Range (Withdrawn 1997) Standard new BOS Vol. 10.04 Committee F01
$ 0.00 Out of stock
Language unavailable
Format unavailable
Related
Reprints and Permissions
Reprints and copyright permissions can be requested through the
Copyright Clearance Center