ASTM F143-73(1978)Withdrawn Standard: ASTM F143-73(1978) Method of Test for Thickness of Epitaxial Layers of Silicon by Measurement of Stacking Fault Dimension (Withdrawn 1985)WITHDRAWN, NO REPLACEMENT There is no PDF download available at this time, however you may purchase a copy of this document from Global Engineering Documents (Email: globalcustomerservice@ihs.com; Phone: 800-854-7179 or 303-397-7956).
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