ASTM F980 - 10e1 Standard Guide for Measurement of Rapid Annealing of Neutron-Induced Displacement Damage in Silicon Semiconductor Devices


    Citing ASTM Standards Citation data is made available by participants in CrossRefs Cited-by Linking service. A comprehensive list of citations to this standard are listed here.

    E1854 Standard Practice for Ensuring Test Consistency in Neutron-Induced Displacement Damage of Electronic Parts

    F1190 Standard Guide for Neutron Irradiation of Unbiased Electronic Components


    Referenced ASTM Standards The documents listed below are referenced within the subject standard but are not provided as part of the standard.

    E264 Test Method for Measuring Fast-Neutron Reaction Rates by Radioactivation of Nickel

    E265 Test Method for Measuring Reaction Rates and Fast-Neutron Fluences by Radioactivation of Sulfur-32

    E666 Practice for Calculating Absorbed Dose From Gamma or X Radiation

    E720 Guide for Selection and Use of Neutron Sensors for Determining Neutron Spectra Employed in Radiation-Hardness Testing of Electronics

    E721 Guide for Determining Neutron Energy Spectra from Neutron Sensors for Radiation-Hardness Testing of Electronics

    E722 Practice for Characterizing Neutron Fluence Spectra in Terms of an Equivalent Monoenergetic Neutron Fluence for Radiation-Hardness Testing of Electronics

    E1854 Practice for Ensuring Test Consistency in Neutron-Induced Displacement Damage of Electronic Parts

    E1855 Test Method for Use of 2N2222A Silicon Bipolar Transistors as Neutron Spectrum Sensors and Displacement Damage Monitors

    E1894 Guide for Selecting Dosimetry Systems for Application in Pulsed X-Ray Sources

    F1032 Guide for Measuring Time-Dependent Total-Dose Effects in Semiconductor Devices Exposed to Pulsed Ionizing Radiation (Discontinued 1994)