Standards

ASTM F526 - 11 Standard Test Method for Measuring Dose for Use in Linear Accelerator Pulsed Radiation Effects Tests

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F448 Test Method for Measuring Steady-State Primary Photocurrent

F744M Standard Test Method for Measuring Dose Rate Threshold for Upset of Digital Integrated Circuits [Metric]

F773M Practice for Measuring Dose Rate Response of Linear Integrated Circuits [Metric]

F1893 Guide for Measurement of Ionizing Dose-Rate Survivability and Burnout of Semiconductor Devices

Referenced ASTM Standards The documents listed below are referenced within the subject standard but are not provided as part of the standard.