B488 Standard Specification for Electrodeposited Coatings of Gold for Engineering Uses
F1711 Standard Practice for Measuring Sheet Resistance of Thin Film Conductors for Flat Panel Display Manufacturing Using a Four-Point Probe Method
E2251 Specification for Liquid-in-Glass ASTM Thermometers with Low-Hazard Precision Liquids
F388 Method for Measurement of Oxide Thickness on Silicon Wafers and Metallization Thickness by Multiple-Beam Interference (Tolansky Method) (Withdrawn 1993) Withdrawn. THe last approved version of this historical standard is referenced on www.astm.org.